Minutes, IBIS Quality Committee

02 Sep 2008

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
  Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
* Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
  Lance Wang, IOMethodology
  Lynne Green
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
  Moshiul Haque, Micron Technology
* Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for patent disclosure:

- No one declared a patent.

AR Review:

- Mike post IQ spec 1.1ag to website
  - Done, but 1.1ag was already posted so the new version is 1.1ah.

- Anders make model to test if IBISCHK detects double-counted Pullup/Pulldown
  - Done.
  - Not sure how IBISCHK could detect double counting.
    - Mike: Might check magnitude of negative V and positive V currents
  - Anders: Half of clamp current could be in Pulldown
    - That would be an ugly model
  - First test model fails IBISCHK (can't drive through Vmeas)
  - A second model with weakend curves passes IBISCHK
  - Bob: Might detect knee point in Pullup/Pulldown
  - Mike: Some problems are caused by the separation of clamp curves:
    - Would like a new IBIS model with 3 I/V curves:
      - [High State]
      - [Low State]
      - [Disabled State]
    - Each I/V curve would cover the full range of the state.
    - Should have 6 V/T curve sets for all 6 transitions.
  - Bob: Another company proposed this idea:
    - Raw data requires less processing
    - Some tools don't split up curve data tha same as others
    - Clamp currents would not be handled right

New items:

Continued review of the IBIS Quality Specification:

5.3.13.	{LEVEL 2}  Clamp I-V behavior not double-counted
- Bob: It is common to put current in the wrong table manually.
- Anders: Maybe clamp and PullXX curves should be separated by voltage range
  - There should be no overlap
  - Mike: Extrapolation causes overlap regardless
  - Bob: A good practice is to extend all curves full range
- Bob: Have seen strange clamp shapes produced by transistor clamps
  - Sometimes see things that cause suspicion of double counting
  - Arpad believes this is legal for some 
- We modified this check to encompass all scenarios.
- Bob: Not sure if s2ibis always duplicates ODT currents
  - We changed the note to say "may not" instead of "does not".

5.3.17.	{LEVEL 3} Correlate IV curves to combined curves
- This is now handled by the M + S designations, not by separate checks.
- Marked for deletion

Anders: IBISCHK should warn for large clamp currents
- Bob: Might be a CAUTION check
  - Vendors are trying harder to eliminate WARNINGs
  - Anders: Many do not care about non-monotonic warnings
- Bob: IBISCHK should be 95% right
  - ODT is becoming common, so the leakage warning appears too often

Next meeting:

09 Sep 2008 11-12 AM EST (8-9 AM PST)

Meeting ended at 12:08 PM Eastern Time.
